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Fast atom bombardment
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Fast atom bombardment is an ionization technique used in mass spectrometry in which a beam of high energy atoms strikes a surface to create ions. It was developed by Michael Barber at the University o
Schematic of a fast atom bombardment ion source for a mass spectrometer.
Schematic of a fast atom bombardment ion source for a mass spectrometer.
ThermoQuest AvantGarde MS with quadrupole detector and FAB/EI source.
ThermoQuest AvantGarde MS with quadrupole detector and FAB/EI source.
Secondary-ion mass spectrometry
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Secondary-ion mass spectrometry is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting
Fast atom bombardment
…create ions. It was developed by Michael Barber at the University of Manchester in 1980. When a beam of high energy ions is used instead of atoms (as in secondary ion mass spectrometry), the method is known as liquid secondary ion mass spectrometry (LSIMS). In FAB and LSIMS, the material to be analyzed is mixed with a non-volatile…
Old magnetic sector SIMS, model IMS 3f, succeeded by the models 4f, 5f, 6f, 7f and most recently, 7f-Auto, launched in 2013 by the manufacturer CAMECA
Old magnetic sector SIMS, model IMS 3f, succeeded by the models 4f, 5f, 6f, 7f and most recently, 7f-Auto, launched in 2013 by the manufacturer CAMECA.