Focused ion beam
Videos
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition,
A FIB workstation
Correlative light-ion microscopy of cells on glass. Color image obtained by fluorescence microscope, black-and-white image obtained by scanning ion microscope and London skyline milled by focused ion beam.
TEM sample prepared using a FIB, shown at different length scales. The two left images show the sample imaged using secondary electrons acquired on the FIB which prepared the sample. The right image showing the sample imaged using atomic resolution scanning transmission electron microscopy.
Mass selection in the FIB column
Ion beam
Videos
An ion beam is a beam of ions, a type of charged particle beam. Ion beams have many uses in electronics manufacturing and other industries. There are many ion beam sources, some derived from the mercu
A small ion beam rocket being tested by NASA.
Carl Zeiss Crossbeam 550 – combines a field emission scanning electron microscope (FE-SEM) with a focused ion beam (FIB).
Nanofluidics channels fabricated with a Zeiss Crossbeam 550 L, in a silicon master stamp