Kelvin probe force microscopy, also known as surface potential microscopy, is a noncontact variant of atomic force microscopy. By raster scanning in the x,y plane the work function of the sample can b
A typical scanning Kelvin probe (SKP) instrument. On the left is the control unit with lock-in amplifier and backing potential controller. On the right is the x, y, z scanning axis with vibrator, electrometer and probe mounted.
Simplified illustration of the scanning Kelvin probe (SKP) technique. The probe is shown to vibrate in z, perpendicular to the sample plane. The probe and sample form a parallel plate capacitor as shown.
Block diagram of a scanning Kelvin probe (SKP) instrument showing computer, control unit, scan axes, vibrator, probe, and sample
Atomic force microscopy
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Atomic force microscopy or scanning force microscopy is a very-high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000
An atomic force microscope on the left with controlling computer on the right
Fig. 3: Typical configuration of an AFM. (1): Cantilever, (2): Support for cantilever, (3): Piezoelectric element (to oscillate cantilever at its eigen frequency), (4): Tip (Fixed to open end of a cantilever, acts as the probe), (5): Detector of deflection and motion of the cantilever, (6): Sample to be measured by AFM, (7): xyz drive, (moves sample (6) and stage (8) in x, y, and z directions with respect to a tip apex (4)), and (8): Stage.
Fig. 5: Topographic image forming by AFM. (1): Tip apex, (2): Sample surface, (3): Z-orbit of Tip apex, (4): Cantilever.
Electron micrograph of a used AFM cantilever. Image width ~100 micrometers