Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance or by measuring the change in resonant frequency directly using a feedback circuit to always drive the sensor on resonance.

A phase-locked loop or phase lock loop (PLL) is a control system that generates an output signal whose phase is fixed relative to the phase of an input signal. Keeping the input and output phase in lockstep also implies keeping the input and output frequencies the same, thus a phase-locked loop can also track an input frequency. And by incorporating a frequency divider, a PLL can generate a stable frequency that is a multiple of the input frequency.