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Perylenetetracarboxylic dianhydride
Atomic force microscopy image of a single PTCDA molecule on Si at room temperature.
Atomic force microscopy image of a single PTCDA molecule on Si at room temperature.
Self-assembly of PTCDA molecules on NaCl, scanning tunneling microscopy image.
Self-assembly of PTCDA molecules on NaCl, scanning tunneling microscopy image.
Teinture naturelle Millepertuis 2
Teinture naturelle Millepertuis 2
An atomic force microscope on the left with controlling computer on the right
An atomic force microscope on the left with controlling computer on the right
Fig. 3: Typical configuration of an AFM. (1): Cantilever, (2): Support for cantilever, (3): Piezoelectric element (to oscillate cantilever at its eige
Fig. 3: Typical configuration of an AFM. (1): Cantilever, (2): Support for cantilever, (3): Piezoelectric element (to oscillate cantilever at its eigen frequency), (4): Tip (Fixed to open end of a cantilever, acts as the probe), (5): Detector of deflection and motion of the cantilever, (6): Sample to be measured by AFM, (7): xyz drive, (moves sample (6) and stage (8) in x, y, and z directions with respect to a tip apex (4)), and (8): Stage.
Fig. 5: Topographic image forming by AFM. (1): Tip apex, (2): Sample surface, (3): Z-orbit of Tip apex, (4): Cantilever.
Fig. 5: Topographic image forming by AFM. (1): Tip apex, (2): Sample surface, (3): Z-orbit of Tip apex, (4): Cantilever.
Electron micrograph of a used AFM cantilever. Image width ~100 micrometers
Electron micrograph of a used AFM cantilever. Image width ~100 micrometers