Scanning electron microscope
Videos
A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the samp
Image of pollen grains taken on a SEM shows the characteristic depth of field of SEM micrographs
M. von Ardenne's first SEM
SEM with opened sample chamber
Analog type SEM
Focused ion beam
Videos
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition,
A FIB workstation
Correlative light-ion microscopy of cells on glass. Color image obtained by fluorescence microscope, black-and-white image obtained by scanning ion microscope and London skyline milled by focused ion beam.
TEM sample prepared using a FIB, shown at different length scales. The two left images show the sample imaged using secondary electrons acquired on the FIB which prepared the sample. The right image showing the sample imaged using atomic resolution scanning transmission electron microscopy.
Mass selection in the FIB column