Transmission electron microscopy is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 10
The duplicate of an early TEM on display at the Deutsches Museum in Munich, Germany
A transmission electron microscope (1976)
The electron source of the TEM is at the top, where the lensing system (4,7 and 8) focuses the beam on the specimen and then projects it onto the viewing screen (10). The beam control is on the right (13 and 14)
TEM sample support mesh "grid", with ultramicrotomy sections
Scanning electron microscope
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A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the samp
Transmission electron microscopy
…reveal that the MgO layer within MTJs contains a large number of grain boundaries that may be diminishing the properties of devices. Ion milling (FIB) Scanning electron microscope image of a thin TEM sample milled by FIB. The thin membrane shown here is suitable for TEM examination; however, at ~300-nm thickness, it would not be…
Image of pollen grains taken on a SEM shows the characteristic depth of field of SEM micrographs
M. von Ardenne's first SEM
SEM with opened sample chamber
Analog type SEM