Secondary-ion mass spectrometry is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting
Old magnetic sector SIMS, model IMS 3f, succeeded by the models 4f, 5f, 6f, 7f and most recently, 7f-Auto, launched in 2013 by the manufacturer CAMECA.
Fast atom bombardment
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Fast atom bombardment is an ionization technique used in mass spectrometry in which a beam of high energy atoms strikes a surface to create ions. It was developed by Michael Barber at the University o
Secondary-ion mass spectrometry
…launched in 2013 by the manufacturer CAMECA. Acronym SIMS Classification Mass spectrometry Analytes Solid surfaces, thin films Other techniques Related Fast atom bombardment Microprobe Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the…
Schematic of a fast atom bombardment ion source for a mass spectrometer.
ThermoQuest AvantGarde MS with quadrupole detector and FAB/EI source.